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DONGWOO OPTRON

Overview
  • Total Patents
    24
  • GoodIP Patent Rank
    137,865
  • Filing trend
    ⇩ 75.0%
About

DONGWOO OPTRON has a total of 24 patent applications. It decreased the IP activity by 75.0%. Its first patent ever was published in 2006. It filed its patents most often in Republic of Korea. Its main competitors in its focus markets measurement, semiconductors and optics are KOULIKOV SERGUEI, CHROMALYTICA AB and BRUINS HANS JOACHIM.

Patent filings in countries

World map showing DONGWOO OPTRONs patent filings in countries
# Country Total Patents
#1 Republic of Korea 24

Patent filings per year

Chart showing DONGWOO OPTRONs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yeon Kyu Cheol 23
#2 Kim Young Joon 5
#3 Kang Soon Joong 4
#4 Chu Sung Yong 2
#5 Cha Hee Sang 2
#6 Cho Young Ki 2
#7 Kim Won Tae 2
#8 Kang Soon Jong 2
#9 Hong Jong Won 2
#10 Jeong Hai Yeong 2

Latest patents

Publication Filing date Title
KR102152226B1 Integrated stack gas analyzer of in-situ probe type
KR102009196B1 Multi-point gas analyzer using bundle optic fiber
KR101879614B1 Device for setting reference and calibrating measurement of the optical type gas analyzer
KR101834232B1 Gas measuring apparatus with multi-gas cell structure for measuring multi-point
KR101801087B1 Particle measuring apparatus using light scattering
KR101793982B1 Gas dilution device
KR101774269B1 System for monitoring chimney environment measurement instruments of the cloud base
KR101736765B1 Calibrating and verifying device for in-situ probe type gas analyzer
KR101619154B1 In situ type gas measuring device using tunable laser diode
KR101619143B1 Mixed sample analysis system using an optimized method of concave diffraction grating
KR101529148B1 Two-beam interferometer for portable mid-infrared fourier transform spectrometer
KR101381618B1 Multi-gas analysis device using non dispersion ultraviolet absorption spectrophotometer
KR101317059B1 Multi-gas analysis device for ultra-violet measurements
KR101317058B1 Calibrating device for in-situ stack gas analyzer
KR101258051B1 Protector for probe of in-situ stack gas analyzer
KR101121552B1 In-situ stack gas analyzer having the calibrating device
KR101076295B1 In-situ stack gas analyzer
KR20110138790A In-situ monitoring apparatus of wafer thin film depositing device having plurality of wafer pocket
KR101093576B1 Device and method for measuring multiplex wavelength radiation temperature using wavelength variable laser ray oscillation means
KR20110125843A System for calibrating in-situ stack gas analyzer