ACTIVE IMPULSE SYSTEMS INC has a total of 12 patent applications. Its first patent ever was published in 1997. It filed its patents most often in United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement are AERODYNAMICS NAT KEY LAB, METRICORR APS and TOUYOKO ERUMESU KK.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 8 | |
#2 | WIPO (World Intellectual Property Organization) | 4 |
# | Industry | |
---|---|---|
#1 | Measurement |
# | Technology | |
---|---|---|
#1 | Analysing materials | |
#2 | Measuring length, angles and areas |
# | Name | Total Patents |
---|---|---|
#1 | Fuchs Martin | 12 |
#2 | Rogers John A | 12 |
#3 | Banet Matthew J | 12 |
#4 | Nelson Keith A | 5 |
#5 | Hanselman John | 4 |
#6 | Maznev Alexei | 1 |
#7 | Crimmins Timothy F | 1 |
Publication | Filing date | Title |
---|---|---|
WO9900641A1 | Improved method and apparatus for measuring the concentration of ions implanted in semiconductor materials | |
US6069703A | Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure | |
US6256100B1 | Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure | |
US6052185A | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials | |
US5812261A | Method and device for measuring the thickness of opaque and transparent films |