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IMEC VZW

Overview
  • Total Patents
    2,101
  • GoodIP Patent Rank
    834
  • Filing trend
    ⇧ 20.0%
About

IMEC VZW has a total of 2,101 patent applications. It increased the IP activity by 20.0%. Its first patent ever was published in 1995. It filed its patents most often in EPO (European Patent Office), United States and China. Its main competitors in its focus markets semiconductors, measurement and optics are IMEC, YAMAKAWA MASAMI and AKIYAMA SHOJI.

Patent filings per year

Chart showing IMEC VZWs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Rottenberg Xavier 82
#2 Chan Boon Teik 79
#3 Peumans Peter 67
#4 Lagae Liesbet 64
#5 Beyne Eric 60
#6 Stakenborg Tim 55
#7 Van Dorpe Pol 55
#8 Genoe Jan 51
#9 Ryckaert Julien 46
#10 Catthoor Francky 41

Latest patents

Publication Filing date Title
US2021119069A1 Single-photon avalanche diode and a sensor array
US2021088901A1 Photoresist for euv and/or e-beam lithography
CN111799221A Method for forming semiconductor device
WO2020255467A1 Solid electrolyte, electrode, power storage element, and method for producing solid electrolyte
US2020204745A1 Use of Spectral Leaks to Obtain High Spatial Resolution Information for Hyperspectral Imaging
US2020211839A1 Semiconductor devices and methods of manufacturing semiconductor devices
EP3674702A1 Method for sequencing a polynucleotide using a biofet
WO2020126985A1 Addressable micro-reaction chamber array
US2020200604A1 Multicolor sensor for flow cytometry
EP3667299A1 Multimodal imaging system
EP3816658A1 A phase difference measurement device for optical phased arrays
EP3817071A1 Optical sensor and thin film photodiode
EP3647779A1 Field-effect transistor-based biosensor comprising electrolyte-screening layer
EP3817038A1 A method for producing self-aligned gate and source/drain via connections for contacting a fet transistor
EP3813066A1 A spintronic device
EP3813124A1 Split replacement metal gate integration
EP3813096A1 Method for manufacturing an iii-nitride semiconductor structure
EP3809208A1 Holographic imaging device and method
EP3809143A1 A method and a tip substrate for scanning probe microscopy
EP3809457A1 Co-integration of iii-v devices with group iv devices