Failure detection rate calculation device, failure detection rate calculation program and method thereof, as well as test pattern generation apparatus, and test pattern generation program and method thereof
JP2016208156A
Oscillation circuit and phase lock loop
JP2016140021A
Phase detector and digital pll circuit using the same
JP2012257090A
Differential input circuit and voltage characteristic adjustment method for differential input circuit
JP2012253612A
Flip-flop circuit device and processor device using the same
JP2012253561A
Voltage-controlled oscillator
JP2012247300A
Position measurement system
JP2012244199A
Operational-amplifier-less/capacitor-less ad converter and td converter
JP2012033235A
Power source voltage control circuit and control method for sub-threshold sram
JP2012023533A
Level converter circuit
JP2011259208A
Time digital conversion circuit and calibration therefor
JP2011259219A
Pipeline ad converter circuit
JP2011239226A
Synchronous circuit
JP2011223404A
Operation testing method for analog-digital converter, analog-digital converter, and operation testing device for analog-digital converter
