| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 13 | |
| #2 | Taiwan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology | |
| #3 | Optics | |
| #4 | Environmental technology | |
| #5 | Audio-visual technology |
| # | Name | Total Patents |
|---|---|---|
| #1 | Sabbineni Prasad | 4 |
| #2 | Deslandes Herve | 4 |
| #3 | Vickers James S | 3 |
| #4 | Reid Derryck | 2 |
| #5 | Serrels Keith | 2 |
| #6 | Freed Regina | 2 |
| #7 | Vedagarbha Praveen | 2 |
| #8 | Frank Jonathan | 2 |
| #9 | Ippolito Stephen Mbradley | 1 |
| #10 | Meinhardt Wildegger Raiko | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TW201636616A | Method for imaging a feature using a scanning probe microscope | |
| US2015293037A1 | Spectral mapping of photo emission | |
| US2015260789A1 | System and method for fault isolation by emission spectra analysis |