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DAITRON TECHNOLOGY CO LTD

Overview
  • Total Patents
    45
  • GoodIP Patent Rank
    221,916
About

DAITRON TECHNOLOGY CO LTD has a total of 45 patent applications. Its first patent ever was published in 1997. It filed its patents most often in Japan, WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets audio-visual technology, semiconductors and measurement are RICOH GEN ELECTRON RES INST, HEADWAY TECH INC and WILLIAMS ADVANCED MATERIALS IN.

Patent filings in countries

World map showing DAITRON TECHNOLOGY CO LTDs patent filings in countries

Patent filings per year

Chart showing DAITRON TECHNOLOGY CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Igawa Katsuhiko 9
#2 Kondo Jotaro 7
#3 Morishita Keiichi 6
#4 Yokochi Kenichi 4
#5 Murayama Yusuke 4
#6 Fujita Hirotaka 4
#7 Bando Fumikazu 3
#8 Kato Aki 3
#9 Sugiyama Yasuhisa 3
#10 Onoe Minoru 3

Latest patents

Publication Filing date Title
WO2015151137A1 Device for producing semiconductor device and method for producing semiconductor device
WO2015151135A1 Device for producing semiconductor device and method for producing semiconductor device
JP2013038434A Braking device
JP2012041152A Conveying apparatus and conveying method
WO2010026724A1 Microphone check device and check method
JP2010281696A Light emitting element measuring device and light emitting element measuring method
JP2010274630A Method and apparatus for dividing substrate
JP2010135484A Braking device and method
JP2010122182A Inspection jig and inspection device
JP2010122181A Pressing plate and inspection device using the same
JP2009297882A Machining device
JP2009285790A Machining apparatus
JP2009150778A Contact device
JP2009148982A Wafer breaking apparatus
JP2008249644A Inspection device
JP2008232862A Inspection tool and inspection device for inspecting semiconductor element
JP2008155287A Workpiece grinding device and workpiece grinding method
JP2008151546A Wavelength measuring apparatus for semiconductor device, and inspection apparatus for semiconductor device
JP2008093806A Workpiece machining device and workpiece machining method
JP2008053321A Tester for semiconductor laser