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CHINA ELECTRONIC PRODUCT RELIABILITY AND ENV TESTING RES INST

Overview
  • Total Patents
    30
  • GoodIP Patent Rank
    51,900
  • Filing trend
    ⇩ 100.0%
About

CHINA ELECTRONIC PRODUCT RELIABILITY AND ENV TESTING RES INST has a total of 30 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2016. It filed its patents most often in China. Its main competitors in its focus markets computer technology, measurement and digital networks are XIAMEN KECAN INFORMATION TECH CO LTD, MICROTEST INC and SWOBODA GARY L.

Patent filings in countries

World map showing CHINA ELECTRONIC PRODUCT RELIABILITY AND ENV TESTING RES INSTs patent filings in countries
# Country Total Patents
#1 China 30

Patent filings per year

Chart showing CHINA ELECTRONIC PRODUCT RELIABILITY AND ENV TESTING RES INSTs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 En Yunfei 6
#2 He Xiaoqi 5
#3 Luo Hongwei 5
#4 Wang Xiaoqiang 5
#5 Luo Jun 4
#6 Lin Jun 4
#7 Hu Xianghong 4
#8 Huang Chuangmian 4
#9 Yang Chunhui 4
#10 He Chunhua 4

Latest patents

Publication Filing date Title
CN106885673A Servomotor vibration impact experiment device
CN106885935A Time domain voltage measuring method, measurement calibration method and measurement calibration verification method
CN106918538A The Forecasting Methodology and system of Lead-Free Solder Joint interface metal compound growth thickness
CN106878014A Random number key generation device and random number key production method
CN106932294A Computer motherboard method of testing and device
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CN106919839A Hardware Trojan horse detection method and system and its circuit based on quiescent dissipation analysis
CN106771624A Interconnection resistance on-line monitoring system and method
CN106872317A The preprocess method and measuring method of soft magnetic ferrite crystallite dimension measurement
CN106919505A Software Defects Predict Methods and device
CN106646204A FPGA storage resource testing system, method and device
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CN106656663A Bit flip fault injection method and system for CAN (Controller Area Network) bus data link layer
CN106650039A Method and device for predicting atmospheric neutron single particle effect of electronic device
CN106776250A Individual event alternating-current parameter altitude touch method of evaluating performance and the device of FPGA device
CN106599556A Comprehensive performance evaluation method and device for integrated circuits
CN106650043A Method and system for evaluating correlation between acceleration simulation test and natural environment test
CN106529306A System safety assessment method and device
CN106768014A Industrial robot Reliability Synthesis detection means