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SHENGKE NANO SUZHOU CO LTD

Overview
  • Total Patents
    25
  • GoodIP Patent Rank
    63,741
About

SHENGKE NANO SUZHOU CO LTD has a total of 25 patent applications. Its first patent ever was published in 2014. It filed its patents most often in China. Its main competitors in its focus markets measurement, semiconductors and optics are QC OPTICS INC, DAGE PREC IND LTD and TOKUSHU TORYO KK.

Patent filings in countries

World map showing SHENGKE NANO SUZHOU CO LTDs patent filings in countries
# Country Total Patents
#1 China 25

Patent filings per year

Chart showing SHENGKE NANO SUZHOU CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Li Xiaomin 24
#2 Hua Younan 18
#3 Zhang Nan 6
#4 Liao Jinzhi 5
#5 Fu Chao 5
#6 Pan Huihui 4
#7 Chen Yan 4
#8 Liu Binghai 4
#9 Zhu Lei 3
#10 Chen Yixin 3

Latest patents

Publication Filing date Title
CN112229699A Sample preparation method for dynamic secondary ion mass spectrometry (D-SIMS)
CN111650019A Sample preparation method for surface analysis of substrate-embedded foreign matter and method for detecting substrate-embedded foreign matter
CN111303869A Application of triiodide ion as fluorescent agent and method for detecting ultramicro cracks of organic light-emitting display film packaging layer
CN111341683A Method for detecting pinhole defect on passivation layer of semiconductor wafer
CN111341684A Characterization method for quality of aluminum bonding pad in semiconductor wafer manufacturing
CN111312609A Method for measuring thickness of silicon epitaxial layer on silicon substrate
CN111257071A Preparation method of sample for dynamic secondary ion mass spectrometer and prepared sample
CN111220636A Method for detecting silicon crystal defects in silicon substrate
CN109406564A The measuring device and method of thermal expansion coefficient
CN109239114A Multifunctional sample platform
CN109444193A The failure analysis method of semiconductor chip
CN109444194A A kind of method for embedding of scanning electron microscope example
CN109360793A The rapid detection method of silicon wafer volume defect on semiconductor crystal wafer substrate
CN109211930A The defect inspection method of electronic display encapsulating material
CN109211928A The detection method of chip surface film layer defect
CN109211929A The detection method of electronic apparatus encapsulation defect
CN109001240A The method for preparing non-conductive material sample
CN104391426A Mask
CN104155158A Method utilizing FIB cutting to achieve three-dimensional observation of nanoscale sample
CN104155390A Preparation method and detection method of semiconductor element trace element detection sample