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BRUKER NANO GMBH

Overview
  • Total Patents
    61
  • GoodIP Patent Rank
    37,297
  • Filing trend
    ⇧ 50.0%
About

BRUKER NANO GMBH has a total of 61 patent applications. It increased the IP activity by 50.0%. Its first patent ever was published in 2009. It filed its patents most often in EPO (European Patent Office), Germany and United States. Its main competitors in its focus markets measurement, electrical machinery and energy and engines, pumps and turbines are GRIFFIN ANALYTICAL TECH, EXTREL CORP and MDS INC DBT MDS SCIEX DIVISION.

Patent filings in countries

World map showing BRUKER NANO GMBHs patent filings in countries

Patent filings per year

Chart showing BRUKER NANO GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Waldschläger Ulrich 11
#2 Schwager Thomas 9
#3 Goran Daniel Radu 8
#4 Hahn Waldemar 8
#5 Falke Meiken 7
#6 Knebel Detlef 5
#7 Baumann Thomas 5
#8 Terborg Ralf 5
#9 Jähnke Torsten 4
#10 Nolze Gert 4

Latest patents

Publication Filing date Title
DE102019134993A1 ARRANGEMENT WITH A MEASURING DEVICE FOR A SCANNING PROBE MICROSCOPE, SCANNING PROBE MICROSCOPE AND METHOD OF OPERATING
EP3770945A1 Kikuchi diffraction detector
DE102019116471A1 Measuring device for a scanning probe microscope and method for examining a measurement sample by scanning probe microscopy with a scanning probe microscope
EP3736561A1 Method for improving an ebsd/tkd map
EP3726205A1 Method for obtaining stereoscopic image information
EP3709008A1 Measurement system for eds/tkd measurement
DE102018130349A1 Measuring device for a scanning probe microscope, scanning probe microscope and method for scanning probe microscopic determination of one or more test samples with a scanning probe microscope
EP3644341A1 Moveable detector
EP3605044A1 Detector, methods for operating a detector and detector pixel circuit
EP3480586A1 X-ray fluorescence spectrometer
EP3267184A1 Method and system for determining the position of a radiation source
DE102014219601A1 Method for scanning a sample by means of an X-ray optics and an apparatus for scanning a sample
DE102014208295A1 Method and arrangement for identifying crystalline phases and a corresponding computer program and a corresponding computer-readable storage medium
DE102014203090A1 Method of identifying a crystallographic candidate phase of a crystal
EP2824448A1 Sample holder for transmission Kikuchi diffraction in SEM
DE102013211327A1 Method for detecting X-rays and device
DE102013202487A1 Device for spatial alignment of an X-ray optics and apparatus with such
DE102012219998A1 Method for identifying crystalline phases in polycrystalline sample used in e.g. airplane, involves determining total quality from quality factors, so as to associate crystal structure with highest total quality to measuring point
DE102012213130A1 Multi-module photon detector and its use
DE102012204399A1 Material testing method and arrangement for material testing