RIGAKU DENKI COMPANY LTD has a total of 17 patent applications. Its first patent ever was published in 1959. It filed its patents most often in United Kingdom, Germany and France. Its main competitors in its focus markets measurement, electrical machinery and energy and mechanical elements are MDS INC DBT MDS SCIEX DIVISION, EXTREL CORP and GRIFFIN ANALYTICAL TECH.
# | Country | Total Patents | |
---|---|---|---|
#1 | United Kingdom | 6 | |
#2 | Germany | 5 | |
#3 | France | 4 | |
#4 | United States | 2 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Electrical machinery and energy | |
#3 | Mechanical elements |
# | Technology | |
---|---|---|
#1 | Analysing materials | |
#2 | Pistons and sealings | |
#3 | Electric discharge tubes |
# | Name | Total Patents |
---|---|---|
#1 | Shimula Yoshihiro | 8 |
#2 | Uchida Hiroshi | 4 |
#3 | Hiroshi Uchida | 2 |
#4 | Yoshihiro Shimula | 2 |
#5 | Shimula Yoshihio | 1 |
#6 | Uchida Kiroshi | 1 |
Publication | Filing date | Title |
---|---|---|
GB1263805A | Fluid seals | |
DE1802704A1 | Cooling device for thin anodes of X-ray tubes | |
GB1249341A | Improvements in or relating to x-ray tubes | |
US3022423A | System for measuring the lattice spacing of crystal by means of x-rays | |
US3051835A | X-ray diffraction system | |
GB936910A | A system for measuring the lattice spacing of a crystal by means of x-rays | |
GB945788A | A system for measuring the lattice spacing of a crystal by means of x-rays | |
GB923025A | An automatic recording system of x-ray diffraction patterns | |
GB921227A | The high temperature furnace for x-ray diffractometer |