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BREITMEIER MESSTECHNIK GMBH

Overview
  • Total Patents
    17
  • GoodIP Patent Rank
    202,664
About

BREITMEIER MESSTECHNIK GMBH has a total of 17 patent applications. Its first patent ever was published in 2007. It filed its patents most often in Germany, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, computer technology and chemical engineering are ATMOSPHERIC SCIENCES INC, SYNTHETIC VISION SYST and 4D TECHNOLOGY CORP.

Patent filings in countries

World map showing BREITMEIER MESSTECHNIK GMBHs patent filings in countries

Patent filings per year

Chart showing BREITMEIER MESSTECHNIK GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Breitmeier Ulrich 14
#2 Breitmeier Ulrich Dr 3

Latest patents

Publication Filing date Title
DE102015104859A1 Method for the temporary locking of a microstructure and / or roughness measuring device, microstructure and / or roughness measuring device for carrying out the method and arrangement of a microstructure and / or roughness measuring device and a test object
DE102014111247A1 Method for adopting at least one property of a roughness meter
DE102012109298A1 Method for cleaning e.g. palpation needle, involves transferring device component, which is to be cleaned to cleaning bag of cleaning apparatus, retaining device component in bag, and cleaning component by blow-off or suction process
DE102012108707A1 Surface profile and/or roughness measuring device for detecting surface profile and/or roughness of surface of object, detects vibration characteristic of vibrating wand or cantilever during approach of wand to surface of object
DE102012101394A1 Roughness or surface microstructure profile meter
DE102010060852A1 Apparatus and method for detecting a surface texture of a surface of a workpiece
DE102010060851A1 Method for evaluation of detected data of image of illuminated surface of work piece by mathematical process, involves conducting structural separation of surface features, particularly surface structures
DE102009035746A1 Surface probe
DE102009019217A1 Method for measuring the outer contour of a stylus of a probe and device for carrying out the method
DE102009019129A1 Positioning device i.e. manipulator, for three-dimensional coordinate measuring device for positioning sensor to detect roughness of workpiece, has body pivoted relative to segment around axis enclosing preset angle with another axis
DE102007008768A1 Workpiece surface's periodic microstructures detection method, involves utilizing transformation illustrating accurately line-shaped periodic microstructure on points of transformation area, on local image signal set