4D TECHNOLOGY CORP has a total of 11 patent applications. Its first patent ever was published in 2003. It filed its patents most often in United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement and computer technology are ATMOSPHERIC SCIENCES INC, BILSKADECENTER STOCKHOLM and YAMAYO SOKUTEIKI KK.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 8 | |
#2 | WIPO (World Intellectual Property Organization) | 3 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Computer technology |
# | Technology | |
---|---|---|
#1 | Measuring length, angles and areas | |
#2 | Measuring light | |
#3 | Image data processing |
# | Name | Total Patents |
---|---|---|
#1 | Millerd James E | 10 |
#2 | Wyant James C | 5 |
#3 | Brock Neal J | 4 |
#4 | Hayes John B | 3 |
#5 | North-Morris Michael | 2 |
#6 | Medower Brian S | 1 |
#7 | Hayes John | 1 |
#8 | Denneau Jr Larry | 1 |
Publication | Filing date | Title |
---|---|---|
US2010309476A1 | Linear-carrier phase-mask interferometer | |
WO2008030580A2 | Synchronous frequency-shift mechanism in fizeau interferometer | |
US2007296978A1 | Chromatic compensation in Fizeau interferometer | |
US2007211256A1 | Linear-carrier phase-mask interferometer | |
US2006203251A1 | Simultaneous phase-shifting fizeau interferometer | |
WO2006080923A1 | Simultaneous phase-shifting fizeau interferometer | |
US7230717B2 | Pixelated phase-mask interferometer | |
US7079251B2 | Calibration and error correction in multi-channel imaging | |
US7057737B2 | Common optical-path testing of high-numerical-aperture wavefronts |