| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Japan | 7 | |
| #2 | Republic of Korea | 3 | |
| #3 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Surface technology and coating | |
| #2 | Measurement | |
| #3 | Machines | |
| #4 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Single-crystal-growth | |
| #2 | Scanning-probe techniques | |
| #3 | Unspecified technologies | |
| #4 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Tokura Yoshinori | 3 |
| #2 | Ozeki Masashi | 2 |
| #3 | Susan Philip Jarvis | 2 |
| #4 | Ohashi Katsufumi | 2 |
| #5 | Sai Sho | 1 |
| #6 | Asamrtsu Atsushi | 1 |
| #7 | Yamada Takafumi | 1 |
| #8 | Jarvis Suzanne Philippa | 1 |
| #9 | Kawasaki Masashi | 1 |
| #10 | Tomioka Yasuhide | 1 |
| Publication | Filing date | Title |
|---|---|---|
| JP2002287186A | Thin copper oxide material film having nonlinear optical effect and method of manufacturing the same and optical waveguide element using the thin copper oxide material film | |
| JP2000356700A | Metal monohalide molecular beam generating device | |
| JP2000211998A | Oxidation of silicon and production of single crystal silicon oxide film using the same | |
| JP2000171381A | Cantilever | |
| JP2000156352A | Formation of high density quantum dot | |
| JP2000019092A | Method for controlling force of scanning probe | |
| JPH11274079A | Semiconductor device and manufacture thereof |