Learn more

AKTSIONERNOE OBSHCHESTVO NAUCHNO ISSLEDOVATELSKIJ INST OPTIKO ELEKTRONNOGO PRIBOROSTROENIYA AO NII O

Overview
  • Total Patents
    13
  • GoodIP Patent Rank
    133,472
  • Filing trend
    0.0%
About

AKTSIONERNOE OBSHCHESTVO NAUCHNO ISSLEDOVATELSKIJ INST OPTIKO ELEKTRONNOGO PRIBOROSTROENIYA AO NII O has a total of 13 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2016. It filed its patents most often in Russian Federation. Its main competitors in its focus markets optics, measurement and chemical engineering are KAWAGUCHI KOGAKU SANGYO KK, JENNER DOLAN INC and JINN HER ENTPR CO LTD.

Patent filings in countries

World map showing AKTSIONERNOE OBSHCHESTVO NAUCHNO ISSLEDOVATELSKIJ INST OPTIKO ELEKTRONNOGO PRIBOROSTROENIYA AO NII Os patent filings in countries
# Country Total Patents
#1 Russian Federation 13

Patent filings per year

Chart showing AKTSIONERNOE OBSHCHESTVO NAUCHNO ISSLEDOVATELSKIJ INST OPTIKO ELEKTRONNOGO PRIBOROSTROENIYA AO NII Os patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Venzel Vladimir Ivanovich 4
#2 Dmitriev Igor Yurevich 3
#3 Semenov Andrej Aleksandrovich 3
#4 Borodin Vladimir Grigorevich 2
#5 Sirazetdinov Vladimir Sabitovich 2
#6 Lebedev Oleg Anatolevich 2
#7 Nikitin Nikolaj Vitalevich 2
#8 Migel Vyacheslav Mikhajlovich 2
#9 Solk Sergej Voldemarovich 2
#10 Linskij Pavel Mikhajlovich 2

Latest patents

Publication Filing date Title
RU2744847C1 Interferometer with differential measurement function
RU2726219C1 Method for guidance and focusing of radiation on a target and device for its implementation
RU2722974C1 Optical system for forming an infrared image
RU2705177C1 Autocollimation device for centering optical elements
RU2685573C1 Method of focusing optical radiation on object
RU2680657C1 Method for determining wave aberrations of optical system
RU2680615C1 Method for determining deformations of wavefront of light beam caused by waviness of surfaces of optical system
RU2680656C1 Mirror athermalized lens
RU2658106C1 Interference method for definition of the position of the aspheric surface axis and the device for its implementation
RU2654932C1 Device for determining astronomical coordinates of an object
RU2661345C1 Method for simulation of a shock-compressed layer in arc discharge conditions
RU2643075C1 Mirror lens
RU2639995C1 Single-mirror off-axis lens