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ADVANCED MFG EDA CO LTD

Overview
  • Total Patents
    17
  • GoodIP Patent Rank
    97,595
About

ADVANCED MFG EDA CO LTD has a total of 17 patent applications. Its first patent ever was published in 2019. It filed its patents most often in China. Its main competitors in its focus markets computer technology, semiconductors and it methods for management are SYNOPSYS SHANGHAI CO LTD, OTSUKA HIROSHI and SYNOPSYS INC.

Patent filings in countries

World map showing ADVANCED MFG EDA CO LTDs patent filings in countries
# Country Total Patents
#1 China 17

Patent filings per year

Chart showing ADVANCED MFG EDA CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 The Inventor Has Waived The Right To Be Cited 1
#2 The Design Has Waived The Right To Be Cited 1

Latest patents

Publication Filing date Title
CN112270157A Method and apparatus for collaborative optimization of design and process and storage medium
CN112201587A Wafer measuring method
CN112180230A Chip test parameter abnormity detection method, storage medium and terminal
CN112117185A Patterning method
CN112149379A Method and apparatus for simulating an integrated circuit and computer readable medium
CN111814116A Method and apparatus for analyzing wafer failure indicators and computer readable medium
CN111710616A Method and apparatus for predicting yield of chip and computer readable medium
CN111652518A Method and apparatus for analyzing process data and computer readable medium
CN111611761A Method, apparatus and computer-readable storage medium for generating circuit layout pattern
CN111597769A Method, apparatus and storage medium for generating circuit layout pattern
CN111597768A Method, apparatus and computer-readable storage medium for constructing a set of layout patterns
CN111611766A Method, apparatus and storage medium for determining circuit layout constraints
CN111523160A Method and apparatus for simulating an integrated circuit and computer readable medium
CN111579961A Method, apparatus and computer-readable storage medium for determining electrical characteristics of a chip
CN111353082A Yield analysis method, device and computer readable storage medium
CN111339724A Method, apparatus and storage medium for generating data processing model and layout
CN111159969A Method and apparatus for generating multi-patterning photomask layout, and computer readable medium