3I SYSTEMS CORP has a total of 11 patent applications. Its first patent ever was published in 2007. It filed its patents most often in China, Taiwan and United States. Its main competitors in its focus markets measurement are PCS INSTR LTD, VOENNAYIA AKADEMIYIA IM F EN D and GUANGZHOU YUANQI HEALTH TECH CO LTD.
# | Country | Total Patents | |
---|---|---|---|
#1 | China | 5 | |
#2 | Taiwan | 2 | |
#3 | United States | 2 | |
#4 | Republic of Korea | 1 | |
#5 | WIPO (World Intellectual Property Organization) | 1 |
# | Industry | |
---|---|---|
#1 | Measurement |
# | Technology | |
---|---|---|
#1 | Analysing materials |
# | Name | Total Patents |
---|---|---|
#1 | Yan Zheng | 6 |
#2 | Li Bo | 6 |
#3 | Gao Jianbo | 4 |
#4 | Chen Wayne | 4 |
#5 | Young Tony | 3 |
#6 | Li Ning | 3 |
#7 | Bo Li | 2 |
#8 | Tiecheng Yang | 2 |
#9 | Zhao Guoheng | 2 |
#10 | Zheng Yan | 2 |
Publication | Filing date | Title |
---|---|---|
CN102253051A | System for detecting defects of solar cell by using line scanning detector | |
CN102253047A | Solar silicon wafer photoluminescence on-line sampling detection system and its detection method | |
CN102253046A | Electroluminescence defect detection and IV detection integrated system for solar cell | |
CN101957321A | Battery silicon wafer detection system | |
CN101021490A | Automatic detecting system and method for planar substrate | |
US2008174771A1 | Automatic inspection system for flat panel substrate | |
US2007222974A1 | Method and system for inspecting surfaces with improved light efficiency |