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FRANTISEK KHOL

Overview
  • Total Patents
    11
About

FRANTISEK KHOL has a total of 11 patent applications. Its first patent ever was published in 1955. It filed its patents most often in United Kingdom and United States. Its main competitors in its focus markets measurement are DO NII GIGIENY TRUDA PROFESSIO, PAAKKINEN ILMARI and SCHILIOV DUMITRU.

Patent filings in countries

World map showing FRANTISEK KHOLs patent filings in countries
# Country Total Patents
#1 United Kingdom 6
#2 United States 5

Patent filings per year

Chart showing FRANTISEK KHOLs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement

Focus technologies

# Technology
#1 Analysing materials

Top inventors

# Name Total Patents
#1 Frantisek Khol 5
#2 Jan Silbanek 1
#3 Jaroslav Talas 1

Latest patents

Publication Filing date Title
GB894796A An x-ray goniometer for structural analysis, adapted for direct measurement of lattice spacings
GB911201A An improved x-ray apparatus for determination of internal stresses in materials
US3113381A Apparatus for evaluating X-ray diffraction records
GB870867A An apparatus for the evaluation of x-ray photographs of fine structure of materials
US2898470A Apparatus for measuring the internal stresses in materials
GB824994A An apparatus for the evaluation of x-ray photographs
US2945300A Apparatus for the evaluation of x-ray photographs
GB816793A A system for determining variations of photographic density of a translucent sheet
US2905046A Apparatus for determining the optical density of sheet materials, and particularly for indicating the photometric curve of x-ray photographs and other images