X TEK SYSTEMS LTD has a total of 14 patent applications. Its first patent ever was published in 2000. It filed its patents most often in EPO (European Patent Office), United Kingdom and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets electrical machinery and energy, medical technology and computer technology are GEN RADIOLOGICAL LTD, DESSAUER FRIEDRICH and VEIFA WERKE AKT GES.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 3 | |
#2 | United Kingdom | 3 | |
#3 | WIPO (World Intellectual Property Organization) | 3 | |
#4 | Australia | 2 | |
#5 | China | 2 | |
#6 | United States | 1 |
# | Industry | |
---|---|---|
#1 | Electrical machinery and energy | |
#2 | Medical technology | |
#3 | Computer technology | |
#4 | Measurement | |
#5 | Audio-visual technology |
# | Technology | |
---|---|---|
#1 | Electric discharge tubes | |
#2 | X-ray technique | |
#3 | Image data processing | |
#4 | Analysing materials | |
#5 | Measuring electric variables | |
#6 | Casings and printed circuits |
# | Name | Total Patents |
---|---|---|
#1 | Hadland Roger | 9 |
#2 | Crawley Alan Copeland | 6 |
#3 | Haig Ian George | 6 |
#4 | Keanly Paul Justin | 6 |
#5 | Ramsey Andrew Timothy | 4 |
#6 | Justin Hadland Roger Crawley A | 1 |
#7 | Crawley Alan C | 1 |
#8 | Haig Ian G | 1 |
Publication | Filing date | Title |
---|---|---|
GB0610577D0 | An automatic x-ray inspection system | |
GB0019147D0 | Computed tomography | |
GB0017976D0 | A compact X-ray source |