FR2822553A1
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METHOD AND SYSTEM FOR ILLUMINATING AN OBJECT WITH FOCUSED LIGHT UNDER VARIOUS ANGLES OF INCIDENCE AND MULTI-COLOR LIGHT SOURCE FOR USE IN THIS SYSTEM
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JP2001324450A
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Method and system for illuminating object with focused light at varying angles of incidence and multi-color light source for use therein
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KR20000029839A
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Triangulation-based 3d imaging and processing method and system
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US5617209A
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Method and system for triangulation-based, 3-D imaging utilizing an angled scaning beam of radiant energy
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Triangulation-based 3D imaging and processing method and system
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Grid array inspection system and method
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System and method for analyzing dimensions of can tops during manufacture
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Z-axis measurement system
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Semiconductor device inspection system
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High speed pattern recognizer
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JPS63143828A
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Semiconductor device tester
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JPS63144532A
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Semiconductor device tester
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Apparatus and method for measuring properties of cylindrical objects
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Systems and methods for illuminating objects for vision systems
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Z-axis height measurement system
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DE3340705A1
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High-speed pattern recognition apparatus
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Adaptive video processor
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NL7908616A
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Pattern recognition using digitised video signal - is normalised w.r.t. light source intensity by comparison with opaque image signal
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IL58149D0
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A pattern recognition system and method the preparation of diphenyl ether-carboxylic acids
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GB2029958A
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Pattern recognition apparatus and method
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