Learn more

UTECHZONE CO LTD

Overview
  • Total Patents
    544
  • GoodIP Patent Rank
    5,306
  • Filing trend
    ⇧ 48.0%
About

UTECHZONE CO LTD has a total of 544 patent applications. It increased the IP activity by 48.0%. Its first patent ever was published in 2001. It filed its patents most often in Taiwan, China and United States. Its main competitors in its focus markets computer technology, measurement and audio-visual technology are BEIJING WEIJIE DONGBO INFORMATION TECH CO LTD, PERNER PETRA and PIXEL VELOCITY INC.

Patent filings in countries

World map showing UTECHZONE CO LTDs patent filings in countries

Patent filings per year

Chart showing UTECHZONE CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Tsou Chia-Chun 164
#2 Lin Po-Tsung 65
#3 Fang Chih-Heng 54
#4 Tsou Chia Chun 53
#5 Zou Jiajun 37
#6 Lin Chieh-Yu 32
#7 Lin Po Tsung 25
#8 Ambikapathi Arulmurugan 21
#9 Fang Chih Heng 18
#10 Hsu Ming-Tang 16

Latest patents

Publication Filing date Title
CN111521614A Automatic optical detection system for measuring porous structure
TWI707130B Carrier device, optical inspection apparatus and optical inspection method
TWI714301B Defect of photoresist chip detection system and method thereof
TWI710762B An image classification system
CN110793968A Detection equipment for identifying pore wall defects
TWI701122B Multi-axis robot arm system and path planning method thereof
TWI702373B A flipping multi-axis robot arm device and optical inspection apparatus comprising thereof
TW202030454A An automatic optical inspection system, and method for measuring a hole structure
TW202007954A Detecting apparatus for identifying defect of hole wall
TW202024602A Single-sided and double-sided sidewall inspection system and paired mirror assembly device
TW202021887A Inspection apparatus for reel tape workpiece
TW202020418A An automatic optical inspection system
TWI680406B Suspended double-sided optical inspection apparatus
TWI653417B Light source module
TWI675719B Three-dimensional processing unit, processing system and processing method for irregular surfaces
TW202007957A Semiconductor defects inspection apparatus
TW202007926A Table device and flatness detection adjustment equipment
TW202006608A Recursive training method and detection system for deep learning system
TW202001764A Method and system for evaluating efficacy of manual defect pattern inspection
TW202001696A Defect inspection and classification apparatus and training apparatus using deep learning system