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UNRE SHANGHAI INFORMATION TECH CO LTD

Overview
  • Total Patents
    94
  • GoodIP Patent Rank
    15,323
  • Filing trend
    ⇧ 1160.0%
About

UNRE SHANGHAI INFORMATION TECH CO LTD has a total of 94 patent applications. It increased the IP activity by 1160.0%. Its first patent ever was published in 2017. It filed its patents most often in China. Its main competitors in its focus markets computer technology, audio-visual technology and digital networks are PERSONIFY INC, PALMWIN INFORMATION TECH SHANGHAI CO LTD and ARCSOFT CORP LTD.

Patent filings in countries

World map showing UNRE SHANGHAI INFORMATION TECH CO LTDs patent filings in countries
# Country Total Patents
#1 China 94

Patent filings per year

Chart showing UNRE SHANGHAI INFORMATION TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Wu Yuehua 37
#2 Yuan Danshou 21
#3 Dai Youjun 20
#4 Sun Yansheng 19
#5 Huang Peijie 12
#6 Shen Yong 8
#7 Li Pengcheng 2
#8 Li Jiaqi 1
#9 Huang Jiajie 1
#10 Li Song 1

Latest patents

Publication Filing date Title
CN110276838A Model acquisition methods and device based on laser-projector
CN110288680A Image generating method and mobile terminal
CN110264558A Model acquisition methods and device based on laser-projector
CN110276792A Model acquisition methods and device based on digital filter
CN110176065A Model acquisition methods and device based on space encoding
CN110176034A Localization method and end of scan for VSLAM
CN110288650A Data processing method and end of scan for VSLAM
CN110264506A Imaging method and device based on space encoding
CN110163919A Three-dimensional modeling method and device
CN110163958A Modeling method and device based on projection grating modeling
CN110188616A Space modeling method and device based on 2D and 3D image
CN109900223A Imaging method and device for projection grating modeling
CN110188604A Face identification method and device based on 2D and 3D image
CN109900222A Model acquisition methods and device based on projection grating modeling
CN110012280A TOF mould group and VSLAM calculation method for VSLAM system
CN110060302A Analysis system and method for camera and projector calibrating
CN110060301A Calibration system and method for projection grating modeling
CN109767490A Image analysis system and method for projection grating modeling
CN109883354A Regulating system and method for projection grating modeling
CN109798841A The calibration system and method for camera and projector