| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 6 | |
| #2 | Taiwan | 2 | |
| #3 | China | 1 | |
| #4 | Hungary | 1 | |
| #5 | Republic of Korea | 1 | |
| #6 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology | |
| #3 | Optics | |
| #4 | Audio-visual technology | |
| #5 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Measuring length, angles and areas | |
| #2 | Analysing materials | |
| #3 | Optical systems | |
| #4 | Image data processing | |
| #5 | Semiconductor devices | |
| #6 | Television |
| # | Name | Total Patents |
|---|---|---|
| #1 | Srocka Bernd | 12 |
| #2 | Schmidt Christine | 5 |
| #3 | Langhans Ralf | 5 |
| #4 | Flon Stanislas | 3 |
| #5 | Raue Hagen | 1 |
| #6 | Döring Marko | 1 |
| #7 | Siahkali Arman | 1 |
| Publication | Filing date | Title |
|---|---|---|
| EP3477252A1 | Apparatus for the detection of the surface profile of a surface of an object using interferometry distance measurement | |
| EP3124912A1 | Method and assembly for determining the thickness of a layer in a stack of layers |