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TIANJIN TONGYANG TECH DEV CO LTD

Overview
  • Total Patents
    11
  • GoodIP Patent Rank
    157,814
About

TIANJIN TONGYANG TECH DEV CO LTD has a total of 11 patent applications. Its first patent ever was published in 2015. It filed its patents most often in China. Its main competitors in its focus markets measurement, packaging and shipping and thermal processes are WENZHOU DARONG TEXTILE INSTR CO LTD, STANHOPE SETA LTD and SUZHOU LANSCIENTIFIC CO LTD.

Patent filings in countries

World map showing TIANJIN TONGYANG TECH DEV CO LTDs patent filings in countries
# Country Total Patents
#1 China 11

Patent filings per year

Chart showing TIANJIN TONGYANG TECH DEV CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chen Wenliang 11
#2 Fan Haichun 6
#3 Li Xinghua 4
#4 Xiao Yunlong 4
#5 Wang Feng 3
#6 Li Qifeng 3
#7 Zhao Yang 3
#8 Li Chenxi 2
#9 Chen Zhanquan 2
#10 Cong Kai 2

Latest patents

Publication Filing date Title
CN106809474A Temperature controlled filter membrane storage device is carried out based on semiconductor refrigerating
CN106841112A Telemetering motor vehicle tail equipment based on NDIR and diffusing reflection technology
CN106813950A Air particle Automatic change film sampler device based on station design
CN106370483A Seven-station rotating disc type heavy metal accumulation sampling device based on nanometer functional material
CN106353174A Heavy metal decomposing device based on vibration decomposing method
CN106442026A Seven-station sampling, rotating disc type heavy metal enriching sampling and pretreatment system based on nano functional material
CN106370569A Particulate matter online monitor signal pre-processing circuit based on Mie scattering
CN106353148A Automatic PM2.5 sampler film replacing device and use method thereof
CN106706476A Mechanical installation and adjustment mechanism of open type fugitive dust on-line monitoring system
CN106290094A The mie being applied to airborne dust particulate matter on-line monitoring scatters quick calculation method
CN106290093A Particle concentration based on mie scattering theory monitoring system and using method thereof