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THERMO ELECTRON SCIENT INSTR

Overview
  • Total Patents
    85
  • GoodIP Patent Rank
    216,828
About

THERMO ELECTRON SCIENT INSTR has a total of 85 patent applications. Its first patent ever was published in 2005. It filed its patents most often in WIPO (World Intellectual Property Organization), United States and China. Its main competitors in its focus markets measurement, optics and electrical machinery and energy are WHITE JOHN U, PROCESS INSTR INC and MYRICK MICHAEL L.

Patent filings per year

Chart showing THERMO ELECTRON SCIENT INSTRs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Deck Francis J 23
#2 Coffin John Magie 14
#3 Izzia Federico 12
#4 Iverson John R 8
#5 Ashmead Damian W 6
#6 Bradley Michael S 6
#7 Grenov Alexander I 6
#8 Ritter Garry L 6
#9 Stocker Dean A 6
#10 Rohde David B 6

Latest patents

Publication Filing date Title
WO2013173203A1 Ultra broadband multilayer dielectric beamsplitter coating
US2013096883A1 Multi-component regression/multi-component analysis of time series files
WO2013009404A2 Optical spectrometer with underfilled fiber optic sample interface
CN103582839A Macro area camera for an infrared (IR) microscope
WO2012141917A1 Bellows actuated infrared stage
WO2012015568A1 Correcting the motion of a monochromator
WO2012012100A1 Intelligent multi-functional macros language for analytical measurements
CN102549711A Emissivity enhanced mid IR source
WO2010017112A1 Synergistic energy-dispersive and wavelength-dispersive x-ray spectrometry
US2008319714A1 Processing of spectrometer pile-up events
US7688530B1 Mounting system for precision mounting of interchangeable optical components
US2009210194A1 Efficient spectral matching, particularly for multicomponent spectra
US7595873B1 Rapid spatial averaging over an extended sample in a Raman spectrometer
WO2008027930A2 Spectroscope with spatial resolution control
US2008049220A1 Spectroscopic microscopy with image-driven analysis
WO2008060326A2 Deicing of radiation detectors in analytical instruments
WO2007109188A2 Spectral measurement with assisted data analysis
WO2007103130A2 Spectrometer signal quality improvement via exposure time optimization
US2007188753A1 Spectrometric measurements during blending / mixing
US2007222988A1 Vibrational circular dichroism spectrometer using reflective optics