TEST ADVANTAGE INC innovation strategy

Patent filings in countries

#	Country	Total Patents
#1	United States	11
#2	EPO (European Patent Office)	7
#3	Israel	6
#4	Japan	6
#5	Republic of Korea	5
#6	WIPO (World Intellectual Property Organization)	5
#7	Canada	4
#8	Australia	2
#9	Singapore	1

#	Technology
#1	Measuring electric variables
#2	Semiconductor devices
#3	Control or regulating systems
#4	Data recognition and presentation
#5	Electric digital data processing
#6	Static stores
#7	Specific computer systems
#8	Climate change mitigation in goods production

Publication	Filing date	Title
US2011178967A1	2011-03-09	Methods and apparatus for data analysis
US2008091977A1	2007-09-19	Methods and apparatus for data analysis
US2008021677A1	2007-03-27	Methods and apparatus for data analysis
IL181444D0	2007-02-20	Methods and apparatus for hybrid outlier detection
WO2007098426A2	2007-02-17	Methods and apparatus for data analysis
IL172850D0	2005-12-27	Methods and apparatus for data analysis
WO2006023744A2	2005-08-19	Methods and apparatus for local outlier detection
SG149899A1	2005-02-07	Methods and apparatus for data analysis
US2005278597A1	2005-02-07	Methods and apparatus for data analysis
US7395170B2	2004-04-02	Methods and apparatus for data analysis
US7225107B2	2003-12-07	Methods and apparatus for data analysis
CA2490404A1	2003-06-27	Methods and apparatus for test process enhancement
US7167811B2	2003-02-14	Methods and apparatus for data analysis
IL159009D0	2002-05-24	Methods and apparatus for semiconductor testing
WO02095508A1	2002-05-24	Methods and apparatus for data smoothing
US6442499B1	2001-07-10	Methods and apparatus for statistical process control of test