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TECHNOS KENKYUSHO KK

Overview
  • Total Patents
    18
About

TECHNOS KENKYUSHO KK has a total of 18 patent applications. Its first patent ever was published in 1991. It filed its patents most often in Japan. Its main competitors in its focus markets measurement are WILLY NELLISSEN, NANJING YITE BIOTECHNOLOGY CO LTD and PROIZV OB PROMAVTOMATIKA N.

Patent filings in countries

World map showing TECHNOS KENKYUSHO KKs patent filings in countries
# Country Total Patents
#1 Japan 18

Patent filings per year

Chart showing TECHNOS KENKYUSHO KKs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement

Focus technologies

# Technology
#1 Analysing materials

Top inventors

# Name Total Patents
#1 Terada Shinichi 18
#2 Kawabata Junji 2
#3 Nishihagi Kazuo 2
#4 Masaki Motohisa 1
#5 Yamashita Noboru 1
#6 Murakami Hiroyoshi 1

Latest patents

Publication Filing date Title
JP2006053012A Fluorescent x-ray analyzer
JP2004219388A X-ray apparatus
JP2002162499A X-ray reflecting element, and method and device for manufacturing the same, and x-ray analyzer
JP2001235437A Total reflection fluorescence x-ray analyzer
JP2000321223A Multilayer thin-film composition measuring method
JPH11108861A Fluorescent x-ray analyzer and fluorescent x-ray detector
JPH10335691A Semiconductor detector
JPH10325814A Secondary target device and fluorescent x-ray analyzer
JPH10318737A Measuring method for film thickness
JPH10185846A X-ray analysis device and x-ray irradiation angle setting method
JPH08220027A X-ray fluorescence analyzer
JPH08136479A Total reflection-type fluorescent x-ray analyzing apparatus
JPH08122281A Fluorescent x-ray analyzer
JPH08114562A Liquid sample holder and liquid sample analyzer
JPH06308059A Fluorescent x-ray analyzer and setting method for x-ray irradiation angle
JPH06223750A X-ray generator and fluorescent x-ray analyzer
JPH06186344A Semiconductor detector
JPH05118999A X-ray analyzing device