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TAICANG CHEN KAI ELECTRONICS PREC MACHINERY CO LTD

Overview
  • Total Patents
    16
  • GoodIP Patent Rank
    102,192
About

TAICANG CHEN KAI ELECTRONICS PREC MACHINERY CO LTD has a total of 16 patent applications. Its first patent ever was published in 2018. It filed its patents most often in China. Its main competitors in its focus markets measurement, machines and packaging and shipping are UEBERREITER EKKEHARD, HUMO LABORATORY LTD and WILLBERG HANS HEINRICH.

Patent filings in countries

World map showing TAICANG CHEN KAI ELECTRONICS PREC MACHINERY CO LTDs patent filings in countries
# Country Total Patents
#1 China 16

Patent filings per year

Chart showing TAICANG CHEN KAI ELECTRONICS PREC MACHINERY CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Shen Xianghui 16
#2 Wu Xishan 7
#3 Zhuang Shuzhen 2
#4 Yin Chenglin 2

Latest patents

Publication Filing date Title
CN112213599A Rectifier bridge insulation test device
CN112222017A Multi-station parallel testing device for rectifier bridge
CN112264315A Appearance detection device of rectifier bridge
CN112246518A Automatic single-rail gluing system for high-voltage silicon stack
CN111243995A Crystal shaking machine
CN111289830A TO-3P packaging element's waveform test mechanism
CN111273151A High-voltage diode high-voltage testing device with double-hump structure
CN111025120A Dynamic testing device for insulated gate bipolar transistor
CN111025119A Static test device of insulated gate bipolar transistor
CN111054664A Automatic bent angle shaping testing arrangement of diode lead wire
CN111036566A High temperature test machine of car single tube
CN110921234A Silicon controlled rectifier consistent machine with foldable loading attachment
CN109018889A A kind of blunt Test Diode of glass and Printing machine
CN108946111A A kind of rectifier bridge film dancing automatic discharge machine
CN109047006A A kind of IGBT module full-automatic testing cohoront machine
CN109047041A A kind of auto rectifier high current heat is surveyed and classifier and its method