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TAE YANG INFORMATION SYSTEM

Overview
  • Total Patents
    29
  • GoodIP Patent Rank
    136,338
  • Filing trend
    ⇩ 100.0%
About

TAE YANG INFORMATION SYSTEM has a total of 29 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2007. It filed its patents most often in Republic of Korea. Its main competitors in its focus markets measurement, computer technology and control are JEILAEROSURVEY CO LTD, ALL4LAND and YOOSUNG INC.

Patent filings in countries

World map showing TAE YANG INFORMATION SYSTEMs patent filings in countries
# Country Total Patents
#1 Republic of Korea 29

Patent filings per year

Chart showing TAE YANG INFORMATION SYSTEMs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Cho Sung Hwan 17
#2 Park Sook Hee 12

Latest patents

Publication Filing date Title
KR101848327B1 Image processing systme for distortion correction of data
KR101820126B1 Error range adjustment drawing system using real time correcting of spatial imagery dawing image
KR101809655B1 stereographic image securing apparatus for spatial imagery ploting
KR101848326B1 Image processing system for 3-dimensional modeling data of underground facility
KR101820125B1 System for auto correcting error of increasing mapping and editing condition
KR101848325B1 Image processing system for synthesizing image data and photographing image
KR101848324B1 A system that monitors changes in the location of features and applies them to digital maps
KR101820124B1 Control point survey apparatus for precision improvement of numerical map
KR101795012B1 Image processing system for precise processing of aerial image data and images
KR101813563B1 Totalstation for geodetic survey
KR101809648B1 Apparatus for maintaining target upright for geodetic surveying
KR101813562B1 Apparatus for fixing staff on ground in geodetic surveying
KR101217242B1 Plotting instrument for controlling the speed
KR101195584B1 Plotting instrument handwheel device equipped with a keypad
KR101212788B1 Digital map system for combined vector model and manufacturing method using the same
KR101223252B1 Surveying system having automatic alteration for attribute data
KR101228292B1 Digital map system to correct error remotely and manufacturing method using it
KR100878780B1 System for surveying which can measure structure size and coordinates using portable terminal
KR100878779B1 System and method for surveying which can measure structure size using portable terminal
KR100878781B1 Method for surveying which can measure structure size and coordinates using portable terminal