| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 4 | |
| #2 | China | 2 | |
| #3 | EPO (European Patent Office) | 2 | |
| #4 | Japan | 2 | |
| #5 | Australia | 1 | |
| #6 | Brazil | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Packaging and shipping | |
| #3 | Medical technology | |
| #4 | Semiconductors | |
| #5 | Engines, pumps and turbines |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Geophysics | |
| #3 | Transport or storage devices | |
| #4 | X-ray technique | |
| #5 | X-ray microscopes | |
| #6 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Chapin Fletcher L | 8 |
| #2 | Kozol John E | 5 |
| #3 | Hart Liza M | 3 |
| #4 | Johnson Allan O | 3 |
| #5 | Johnson Eric | 2 |
| #6 | Hart Liza | 1 |
| #7 | Kiballa Gerald | 1 |
| #8 | Chapin Fletcher L Kozol John E | 1 |
| #9 | Crocker Michael | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US9093187B1 | Fixed gantry CT system having a non-uniform slit | |
| US2011248177A1 | Test equipment for verification of crystal linearity at high-flux levels | |
| US2008043919A1 | X-ray source assembly | |
| US2006227932A1 | Imaging inspection apparatus |