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ST MICROELECTRONICS RES & DEV

Overview
  • Total Patents
    429
  • GoodIP Patent Rank
    58,775
About

ST MICROELECTRONICS RES & DEV has a total of 429 patent applications. Its first patent ever was published in 2002. It filed its patents most often in EPO (European Patent Office), United Kingdom and United States. Its main competitors in its focus markets computer technology, audio-visual technology and semiconductors are LITAI SCIENCE & TECHNOLOGY CO, OZAKI HIROSHI and RAYNOR JEFFREY.

Patent filings in countries

World map showing ST MICROELECTRONICS RES & DEVs patent filings in countries

Patent filings per year

Chart showing ST MICROELECTRONICS RES & DEVs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Raynor Jeffrey 51
#2 Findlay Ewan 22
#3 Jones Andrew Michael 22
#4 Ryan Stuart 19
#5 Moore John Kevin 16
#6 Mattos Philip 15
#7 Duncan Ed 12
#8 Campbell Colin 12
#9 Warren Robert Geoffrey 11
#10 Kurd Tariq 11

Latest patents

Publication Filing date Title
EP3082165A1 A pixel having a plurality of pinned photodiodes
GB201511551D0 Photonics device
US2016033644A1 Time of flight determination
US9332165B1 Electronic device including camera module unthreaded ends that sealingly engage prior to threaded ends engaging and related methods
US2016191763A1 Electronic device including a camera assembly having an electrically conductive material within a ground plane access opening and related methods
US2016161332A1 Image sensor using pixels with combined rgb and ir sensing
GB201418095D0 Pixel Arrangement
GB201413519D0 A pixel array and method for controlling a pixel array
GB201408082D0 Photosensor arrangements
GB201405773D0 Frequency compensation
GB201405521D0 Methods and apparatus for storing content
GB201405520D0 A circuit for use in scan testing
GB201321062D0 Read-out circuitry for an image sensor
GB201321057D0 Circuitry for configuring entities
GB201321056D0 Debug circuitry
GB201321098D0 Low power die
GB201319683D0 A method and apparatus use with interrupts
GB201318480D0 Testing method, testing apparatus and circuit for use with scan chains
GB201317512D0 Flexible interface
GB201317239D0 Multiple Processor System