| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Finland | 4 | |
| #2 | China | 2 | |
| #3 | United States | 2 | |
| #4 | Australia | 1 | |
| #5 | Canada | 1 | |
| #6 | EPO (European Patent Office) | 1 | |
| #7 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials |
| # | Name | Total Patents |
|---|---|---|
| #1 | Hietanen Iiro | 7 |
| #2 | Keraenen Heimo | 6 |
| #3 | Pyoerret Seppo | 5 |
| #4 | Pyorret Seppo | 3 |
| #5 | Keranen Heimo | 3 |
| #6 | Seppo Hietanen Liro Keranen He | 1 |
| #7 | Seppo Hietanen Iiro Keraenen H | 1 |
| Publication | Filing date | Title |
|---|---|---|
| FI20040733A0 | Method and arrangement for measuring surface contours | |
| FI20040374A0 | Method and arrangement for measuring surface contours | |
| FI20021973A0 | Synchronous optical measuring and checking method and device | |
| FI20012161A0 | Optical method and apparatus for detecting mechanical defects in material |