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SIOS MESTECHNIK GMBH

Overview
  • Total Patents
    15
About

SIOS MESTECHNIK GMBH has a total of 15 patent applications. Its first patent ever was published in 1993. It filed its patents most often in Germany. Its main competitors in its focus markets measurement, telecommunications and optics are HWANG JAE EUN, ANHUI BEILAI ELECTRONIC TECHNOLOGY CO LTD and GLOETZL BAUMESSTECH.

Patent filings in countries

World map showing SIOS MESTECHNIK GMBHs patent filings in countries
# Country Total Patents
#1 Germany 15

Patent filings per year

Chart showing SIOS MESTECHNIK GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Jaeger Gerd 5
#2 Jaeger Gerd Prof Dr 4
#3 Buechner Hans-Joachim 3
#4 Manske Eberhard 3
#5 Hausotte Tino 2
#6 Tilsch Joern Dipl Ing 1
#7 Manske Eberhard Dr Ing 1
#8 Buechner Hans-Joachim Dr Ing 1
#9 Jaeger Gerd Prof 1
#10 Mueller Andreas 1

Latest patents

Publication Filing date Title
DE102012219203B3 Device for force- or displacement measurement, has two meander arrangements connected to each other by coupling piece to form parallel spring arrangement, where each meander arrangement has neutral silicon springs and active silicon springs
DE102011007350A1 Sensor for the tactile measurement of forces and moments
DE102011006922A1 Instrument transformers for sensor technology
DE102010025633A1 Device for measuring small and large forces
DE102008037926B3 Device for tactile measurement of three-dimensional forces, has touch element, tracer pin and parallel spring-elements with strain sensors, where parallel spring-element is arranged transverse to tracer pin
DE102007033441A1 Device for the simultaneous measurement of forces
DE102005056467A1 Surface`s translation and tilt measuring method for scanning probe microscope, involves focusing measuring beam of interferometer with optical system, and utilizing reflecting beam after beam split for measuring surface tilt
DE102005037160A1 Method and device for tactile detection
DE102004061067A1 Arrangement for interferometric path and angle measurement
DE102004023030A1 Multiple beam splitter
DE10019059A1 Method and device for measuring profile deviations
DE19939348A1 Method and device for calibration of applanation tonometers
DE19517467A1 Device for measuring mechanical quantities
DE4306756A1 Temperature measuring device coupled by an optical waveguide
DE4303217A1 Device for frequency-stabilisation of He-Ne internal mirror lasers