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Show Chwan Memorial Hospital

Overview
  • Total Patents
    16
  • GoodIP Patent Rank
    127,420
  • Filing trend
    ⇩ 50.0%
About

Show Chwan Memorial Hospital has a total of 16 patent applications. It decreased the IP activity by 50.0%. Its first patent ever was published in 2012. It filed its patents most often in Taiwan, United States and China. Its main competitors in its focus markets medical technology, measurement and computer technology are POINT ROBOTICS MEDTECH INC, CRYOS TECH INC and GRAUMANN RAINER.

Patent filings in countries

World map showing Show Chwan Memorial Hospitals patent filings in countries

Patent filings per year

Chart showing Show Chwan Memorial Hospitals patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Liu Kai-Che 6
#2 Li Yi-Jun 4
#3 Liu Kai-Zhe 4
#4 Gu Yi-Fang 4
#5 Zhan Shi-Ji 4
#6 Gu Ming-Zhou 4
#7 Huang Shih-Wei 4
#8 Wang Tong-Wen 4
#9 Lin Kun-Wei 4
#10 Wang Min-Liang 3

Latest patents

Publication Filing date Title
CN110693540A Combined minimally invasive surgical instrument
TW201907879A Minimally invasive instrument with instant force feedback function
TWI627444B Stereoscopic microscope of twin digital camera with electric platform position memory
TWI581750B Endoscope imaging system and method
WO2017117710A1 Imaging system and method for endoscopy
TW201713282A A dual lens device for adjustable angle of operation for a stereoscopic microscope
TW201713266A Adjustable light source device for surgical stereomicroscope capable of modulating wavelength in real time to obtain better images and capable of being applied to various types of surgeries
TW201710737A Dimensional image display device for surgical microscope
TW201710738A Lightweight 3D stereoscopic surgical microscope device
TW201629893A Acute illness mobile ambulance method
US2014270516A1 Image enhancement method for improving color perception of colorblind viewers
US2014119510A1 X-ray imaging system for grnerating space transfer functions and method thereof
TW201410212A Camera correction method and system applicable to X-ray machine