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SAE HAN MICRO TECH CO LTD

Overview
  • Total Patents
    43
  • GoodIP Patent Rank
    48,483
  • Filing trend
    ⇧ 133.0%
About

SAE HAN MICRO TECH CO LTD has a total of 43 patent applications. It increased the IP activity by 133.0%. Its first patent ever was published in 2004. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement, electrical machinery and energy and audio-visual technology are HANGZHOU XIHU ELECTRONIC INST, ATG LUTHER & MAELZER GMBH and JEOL RESONANCE INC.

Patent filings in countries

World map showing SAE HAN MICRO TECH CO LTDs patent filings in countries

Patent filings per year

Chart showing SAE HAN MICRO TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Baek Byeong Seon 25
#2 Kim Hak Jun 19
#3 Pyo Chang Ryul 12
#4 Jeon Byung Hee 8
#5 Park Hyun Jin 6
#6 Jeon Jung Su 5
#7 Kim Kyoung Nam 4
#8 Rhee Seung Woo 4
#9 Park Sung Woo 4
#10 Lee Song Kyu 4

Latest patents

Publication Filing date Title
KR102174269B1 Probe assembly for inspection of chip parts
CN111987548A Anisotropic conductive sheet
KR20210014051A Anisotropic conductive sheet
KR102046283B1 Anisotropic conductive sheet
KR102133675B1 Test socket
KR102153221B1 Anisotropic conductive sheet
KR20200115782A Test socket and method of manufacturing the same
KR102101104B1 Polygonal micro contact pin
KR102094618B1 Micro contact pin
KR101976997B1 Apparatus and Method for forming a probe pin
KR20200027656A Anisotropic conductive sheet
KR20200017686A Manufacturing method of anisotropic conductive sheet
KR102030280B1 Manufacturing method of anisotropic conductive sheet
KR102032652B1 Anisotropic conductive sheet with springs
KR20190131249A Apparatus for separately feeding wire
KR20190080686A Anisotropic conductive sheet
KR20190037621A Conductive contact and anisotropic conductive sheet with the same
KR20180131312A Vertical probe pin and probe pin assembly with the same
KR101769355B1 Vertical probe pin and probe pin assembly with the same
KR101755281B1 Apparatus and Method for forming a probe pin