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RIZHSKIJ POLT INST

Overview
  • Total Patents
    1,272
About

RIZHSKIJ POLT INST has a total of 1,272 patent applications. Its first patent ever was published in 1970. It filed its patents most often in USSR (Union of Socialist Soviet Republics), Russian Federation and Germany. Its main competitors in its focus markets materials and metallurgy, machine tools and control are CHEBOKSARSKOE PROIZV OB EDINEN, SP P K T B LITEJNOGO KUZNECHNO and SHCHEPOCHKINA YULIYA ALEKSEEVN.

Patent filings in countries

World map showing RIZHSKIJ POLT INSTs patent filings in countries

Patent filings per year

Chart showing RIZHSKIJ POLT INSTs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Vedmedovskij Viktor A 80
#2 Grejvulis Yanis P 75
#3 Kotovich Gleb N 65
#4 Tsyfanskij Semen L 64
#5 Frejdenfeld Edgar Zh 58
#6 Bumbieris Emil V 47
#7 Sedmalis Uldis Ya 43
#8 Alnis Yanis A 43
#9 Kalejs Mikhail A 40
#10 Magone Martinsh A 40

Latest patents

Publication Filing date Title
SU1746282A1 Method of determination of permittivity of dielectric materials
SU1749050A2 Device for aeration of mixed materials
SU1728731A1 Method for determining friction factor of flexible thread
SU1729570A1 Vibratory-percussion conical crusher
RU1809203C Hydraulic oscillation damper
SU1758766A1 Method of automatic frequency recovery in power system upon emergency frequency decrease
SU1727928A1 Method for adjusting vibrator with non-linear flexible ties and working medium
RU1769329C Dc/dc voltage converter
SU1711315A1 Electrical drive
RU1769974C Vibratory drive
SU1697249A1 Low-capacity electric drive
SU1742752A1 Method of one-sided determination of a distance to the point of single-phase short circuit
SU1709486A1 Small electric drive
RU1781226C Process for producing pyroglutamyl-containing substrates
SU1758784A1 Electric induction machine
SU1767645A1 Voltage transformer error compensator
SU1700733A1 Low-duty high-speed electrical drive unit
SU1746412A1 Device for diagnosing the state of transformer heat exchangers
SU1715782A1 Method of producing heat insulating material
SU1728901A1 Method of determination of semiconductor crystal quality