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RIEGL LASER MEASUREMENT SYSTEMS GMBH

Overview
  • Total Patents
    51
  • GoodIP Patent Rank
    37,832
  • Filing trend
    ⇩ 54.0%
About

RIEGL LASER MEASUREMENT SYSTEMS GMBH has a total of 51 patent applications. It decreased the IP activity by 54.0%. Its first patent ever was published in 2002. It filed its patents most often in Austria, EPO (European Patent Office) and Canada. Its main competitors in its focus markets measurement, computer technology and optics are CHINA AERO GEOPHYSICAL SURVEY & REMOTE SENSING CT FOR LAND & RESOURCES, VOLLATH ULRICH and OURS TECH INC.

Patent filings per year

Chart showing RIEGL LASER MEASUREMENT SYSTEMS GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Ullrich Andreas 21
#2 Rieger Peter 16
#3 Pfennigbauer Martin 10
#4 Reichert Rainer 10
#5 Riegl Johannes 9
#6 Hofbauer Andreas 6
#7 Rainer Ing Reichert 4
#8 Martin Dr Pfennigbauer 4
#9 Riegl Ursula 4
#10 Studnicka Nikolaus 3

Latest patents

Publication Filing date Title
EP3792653A1 Laser scanner
EP3489715A1 Optical device for detecting a light beam reflected on a distant target
EP3623752A1 Method for generating an orthogonal view of an object
AT519765B1 Laser scanner and device for measuring an environment
AT519953A4 Modular laser scanning system
AT519574B1 Device for locating a glare source for an aircraft and use of a laser scanner therefor
AT519559B1 High-cutters
AT519417A1 Method of measuring a condition of a metallurgical vessel in a steel mill and steelwork therefor
AT519103B1 Method, device and vehicle for distance measurement
EP3267224A1 Method for distance measurement
AT517701B1 laser scanner
EP3220160A1 Flying device with laser scanner
EP3048453A1 Device for measuring the distance to an object within a body of water
EP3182159A1 Distance measuring device
AT517300A1 Method for distance measurement
EP3051310A1 Device for the protection of objects by means of laser scanners
AT513950A1 Mounting system for opto-electronic instruments
AT512768A1 Laser scanner
AT510579B1 Laser scanner and method for measuring target spaces
AT509649A1 Opto electronic measurement system