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RENISHAW METROLOGY LTD

Overview
  • Total Patents
    105
About

RENISHAW METROLOGY LTD has a total of 105 patent applications. Its first patent ever was published in 1991. It filed its patents most often in United Kingdom, EPO (European Patent Office) and United States. Its main competitors in its focus markets measurement, machine tools and machines are RENISHIYOU METAROJII LTD, CHONGQING YINGQUAN STANDARD PARTS CO LTD and NINGBO XIANGRUI MACHINERY CO LTD.

Patent filings per year

Chart showing RENISHAW METROLOGY LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Mcmurtry David Roberts 17
#2 Mcmurtry David R 15
#3 Hajdukiewicz Peter 10
#4 Wilson David 6
#5 Hellier Peter K 4
#6 Hellier Peter Kenneth 4
#7 Gonzalez Louis Philibert 4
#8 Wright David Allan 3
#9 Dabbs John Christopher 3
#10 Hellen Graham Andrew 3

Latest patents

Publication Filing date Title
GB9313040D0 Optical inspection probe
GB9312939D0 Measurement probe
GB9309459D0 Touch probe
GB9308703D0 Video inspection probe
GB9308364D0 Probe arm for machine tool
GB9306994D0 Measuring probe and transducing apparatus therefor
GB9306139D0 Method of and apparatus for calibrating machines
GB9305836D0 Touch probe
GB9305687D0 A signal processing for trigger probe
US5390424A Analogue probe
GB9305222D0 Stylus for a touch probe
GB9301822D0 Touch probe and signal processing circuit therefor
GB9301323D0 Method of and apparatus for scanning the surface of a workpiece
GB9300616D0 Video inspection probe
GB9300633D0 Video inspection probe
GB9226934D0 Touch probe and signal processing circuit therefor
GB9225994D0 Device for connecting a shank to a probe
GB9224335D0 A method of measuring workpieces using a surface contacting measuring probe
GB9224339D0 Surface following device
GB9224266D0 Electrical connections for probes