QED TECHNOLOGIES INT INC

Overview

Total Patents

24

About

QED TECHNOLOGIES INT INC has a total of 24 patent applications. Its first patent ever was published in 2001. It filed its patents most often in Republic of Korea, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, machine tools and basic materials chemistry are TENRYU SEIKI KK, PROLASER LTD and QED TECHNOLOGIES INTERNATIONAL.

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Patent filings in countries

World map showing QED TECHNOLOGIES INT INCs patent filings in countries

#	Country	Total Patents
#1	Republic of Korea	8
#2	EPO (European Patent Office)	6
#3	WIPO (World Intellectual Property Organization)	5
#4	China	4
#5	United States	1

Patent filings per year

Chart showing QED TECHNOLOGIES INT INCs patent filings per year from 1900 to 2020

Similar Companies

TENRYU SEIKI KK 96% similarity

PROLASER LTD 90% similarity

QED TECHNOLOGIES INTERNATIONAL 90% similarity

QED TECHNOLOGIES INC 83% similarity

ALFRED LEBERT 83% similarity

CHONGQING WANSHITONG MACHINERY MFG CO LTD 81% similarity

BALANCE SYSTEMS SRL 81% similarity

XI'AN AVIATION POWER CO LTD 80% similarity

NANJING CHERVON AUTO PRECISION TECH CO LTD 79% similarity

CHRIS MARINE AB 78% similarity

Focus industries

#	Industry
#1	Measurement
#2	Machine tools
#3	Basic materials chemistry
#4	Machines
#5	Mechanical elements

Focus technologies

#	Technology
#1	Grinding or polishing devices
#2	Testing of structures
#3	Measuring length, angles and areas
#4	Measuring light
#5	Analysing materials
#6	Unspecified technologies
#7	Blasting
#8	Polishing compositions
#9	Accessories for machine tools
#10	Venting or aerating devices

Top inventors

#	Name	Total Patents
#1	Kordonski William	14
#2	Gorodkin Sergei	7
#3	Sekeres Arpad	7
#4	Forbes Greg W	5
#5	Fleig Jon F	5
#6	Murphy Paul	5
#7	Miladinovic Dragisha	5
#8	Murphy Paul E	5
#9	Devries Gary M	5
#10	Fleig Jon	4

Latest patents

Publication	Filing date	Title
US2014152999A1	2013-11-22	Integrated wavefront sensor and profilometer
WO2014014948A1	2013-07-16	Magnetorheological fluid for ultrasmooth polishing
CN103635288A	2012-04-12	Method and apparatus for measurement and control of magnetic particle concentration in a magnetorheological fluid
WO2012088002A2	2011-12-20	System for magnetorheological finishing of substrates
CN102341216A	2010-03-02	System for magnetorheological finishing of substrate
KR20100134712A	2009-04-08	Stitching of near-nulled subaperture measurements