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PULSTEC IND CO LTD

Overview
  • Total Patents
    310
  • GoodIP Patent Rank
    33,225
  • Filing trend
    ⇩ 11.0%
About

PULSTEC IND CO LTD has a total of 310 patent applications. It decreased the IP activity by 11.0%. Its first patent ever was published in 1995. It filed its patents most often in Japan, WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets measurement, environmental technology and audio-visual technology are ARUTYUNOV MIKHAIL G, HOSODA SHINICHI and AUDIODEV AKTIEBOLAG.

Patent filings in countries

World map showing PULSTEC IND CO LTDs patent filings in countries
# Country Total Patents
#1 Japan 296
#2 WIPO (World Intellectual Property Organization) 8
#3 United States 3
#4 China 2
#5 Austria 1

Patent filings per year

Chart showing PULSTEC IND CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Maruyama Yoichi 65
#2 Ujiie Masahiko 42
#3 Iketani Hirobumi 34
#4 Suzuki Satoshi 23
#5 Hayashi Takayuki 20
#6 Tamaya Mitsuru 19
#7 Takai Toshihisa 13
#8 Fukui Kenji 12
#9 Suyama Hiroyuki 12
#10 Takabayashi Masaki 11

Latest patents

Publication Filing date Title
JP2020128946A X-ray diffraction measuring device
JP2020094874A X-ray diffraction measuring device
JP2020067352A Diffraction ring image pickup device and diffraction ring reader
JP2020030160A Diffraction ring imaging device
JP2020020614A X-ray diffraction measuring device
JP2020020616A X-ray diffraction measuring system and X-ray diffraction measuring device
JP2020020617A X-ray diffraction measuring system
JP2019184392A Stress measurement method
JP2019132599A Carrying object stress measurement device
JP2019109052A X-ray diffraction measurement device
JP2019105580A X-ray diffraction measurement device and x-ray diffraction measurement system
JP2019066336A X-ray diffraction measurement device and x-ray diffraction measurement method
JP2019012051A X-ray diffraction measuring device
JP2018194096A Spring washer, axial force evaluation method and fastening state evaluation method
JP2018179920A Axial force evaluation method using x-ray diffraction measurement device
JP2018165669A Thermal expansion coefficient measurement method and x-ray diffraction measurement device
JP2018124216A Laser light intensity control device and laser light intensity control method
JP2018112421A V-groove depth variable stage and x-ray diffraction measurement device
JP2018091700A X-ray diffraction measurement method, and diffraction ring reading device
JP2017097343A Optical observation device