|
US2005057126A1
|
|
Modular security enclosure for gaming machine
|
|
US5486701A
|
|
Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness
|
|
US5260668A
|
|
Semiconductor surface resistivity probe with semiconductor temperature control
|
|
US5386317A
|
|
Method and apparatus for imaging dense linewidth features using an optical microscope
|
|
US5226118A
|
|
Data analysis system and method for industrial process control systems
|
|
US5067805A
|
|
Confocal scanning optical microscope
|
|
US4951190A
|
|
Multilevel menu and hierarchy for selecting items and performing tasks thereon in a computer system
|
|
US4967381A
|
|
Process control interface system for managing measurement data
|
|
US4945220A
|
|
Autofocusing system for microscope having contrast detection means
|
|
US4843538A
|
|
Multi-level dynamic menu which suppresses display of items previously designated as non-selectable
|
|
US4907931A
|
|
Apparatus for handling semiconductor wafers
|
|
US4873623A
|
|
Process control interface with simultaneously displayed three level dynamic menu
|
|
US4776695A
|
|
High accuracy film thickness measurement system
|
|
US4805089A
|
|
Process control interface system for managing measurement data
|
|
US4679137A
|
|
Process control interface system for designer and operator
|
|
US4755746A
|
|
Apparatus and methods for semiconductor wafer testing
|
|
US4703252A
|
|
Apparatus and methods for resistivity testing
|
