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PROCESS AUTOMATION BUSINESS

Overview
  • Total Patents
    46
About

PROCESS AUTOMATION BUSINESS has a total of 46 patent applications. Its first patent ever was published in 1981. It filed its patents most often in United States, Canada and EPO (European Patent Office). Its main competitors in its focus markets measurement, textiles and paper and packaging and shipping are LIPPKE P, CANNEED INSTR GROUP CO LTD and NANJING YIHUI INSTR EQUIPMENT CO LTD.

Patent filings per year

Chart showing PROCESS AUTOMATION BUSINESSs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Williams Paul 12
#2 Burk Gary N 7
#3 Reed Gordon K 6
#4 Sturm Steven P 5
#5 Sturm Steven Perry 5
#6 Burk Gary Neil 4
#7 Mccanney Thomas O 3
#8 Carson Keith Joseph 2
#9 Dukes John R 2
#10 Carson Keith J 2

Latest patents

Publication Filing date Title
US5243849A On-line caliper gauge
US5122963A Actuation cell response and mapping determinations for web forming machines
US4984622A Apparatus for supplying temperature regulated air to a calender roll
US4965452A Infrared analysis of paper printability
US4975151A Two-speed single lever stepper actuator
US5020356A Method and apparatus for measuring characteristics of a multilayer product
US4990784A Nonlinear averaging compensated measurements
US4879003A Slice lip protector system
US5157973A Pressure sensor with integral overpressure protection
US4877485A Sheet inspection station with pneumatic sheet guide
US4926698A Dual wedge flow element
CA1319273C Clay sensor
US4892623A Two-speed stepper actuator
US4954891A Light guided illuminating/sectioning device for sheet inspection system
US4950911A Apparatus and method for inspecting sheet material
EP0297271A2 Sheet inspection station with pneumatic sheet guide
US4944594A Apparatus and method for measuring dark and bright reflectances of sheet material
US4837573A Digital to analog converter
US4823008A Apparatus and methods employing infrared absorption means to measure the moisture content of heavy grades of paper
US4801809A Sheet inspection apparatus and methods providing simultaneous resolution of measurement zones and wavelength bands