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PHASE METRICS

Overview
  • Total Patents
    55
About

PHASE METRICS has a total of 55 patent applications. Its first patent ever was published in 1991. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Australia. Its main competitors in its focus markets audio-visual technology, measurement and electrical machinery and energy are TANASHIN DENKI CO, ITO KIYOTAKA and TRACE MOUNTAIN PROD INC.

Patent filings per year

Chart showing PHASE METRICSs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lacey Christopher 11
#2 Womack Kenneth H 8
#3 Inbar Michael 5
#4 Jann Peter C 5
#5 Lacey Christopher A 5
#6 Ross Edward W 5
#7 Brezoczky Blasius 4
#8 Lee Patrick R 3
#9 Iosilevsky Igor 3
#10 Baker Bill R 2

Latest patents

Publication Filing date Title
WO9802715A1 Coatings for simultaneous control of tribological and optical properties of interferometric reference surfaces
WO9738324A1 Testing of multiple magnetic recording heads
US5767964A Slider for calibration and correlation of flying height testers
US5777740A Combined interferometer/polarimeter
WO9727467A1 Revisit station for an optical scanner
WO9726529A1 Surface inspection apparatus and method
US5719840A Optical sensor with an elliptical illumination spot
US5783882A Conductive contact for an air bearing spindle
US5801464A Pressurized air-ionization ground for an air bearing spindle
US5696585A Apparatus and method for efficient electrostatic discharge on glass disks in flying height testers
US5696653A Tooling for holding a head gimbal assembly
US5692840A Crash tolerant air bearing spindle
WO9722121A1 A variable pneumatic loader for testing a disk drive head gimbal assembly
US5706080A Single test station that can test a flying height and electrical characteristics of a recording head
WO9717621A1 Method and apparatus for measuring the smoothness of a magnetic disk
US5883714A Method and apparatus for detecting defects on a disk using interferometric analysis on reflected light
US5781299A Determining the complex refractive index phase offset in interferometric flying height testing
US5689329A Flying height altitude simulator
US5792947A Method and apparatus for combined glide and defect analysis
US5760989A Method and apparatus for captive clock head assembly