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OXFORD INSTR ANALYTICAL OY

Overview
  • Total Patents
    59
  • GoodIP Patent Rank
    162,471
  • Filing trend
    ⇩ 100.0%
About

OXFORD INSTR ANALYTICAL OY has a total of 59 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2001. It filed its patents most often in United States, EPO (European Patent Office) and Japan. Its main competitors in its focus markets measurement, semiconductors and electrical machinery and energy are LINK ANALYTICAL LTD, JUN SEUNG IK and FIFE KEITH.

Patent filings in countries

World map showing OXFORD INSTR ANALYTICAL OYs patent filings in countries
# Country Total Patents
#1 United States 25
#2 EPO (European Patent Office) 19
#3 Japan 7
#4 China 5
#5 Finland 3

Patent filings per year

Chart showing OXFORD INSTR ANALYTICAL OYs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Sipilae Heikki Johannes 11
#2 Kiuru Erkki Sakari 7
#3 Eklin Tero 7
#4 Nenonen Seppo 6
#5 Pasi Kostamo 6
#6 Sipilae Heikki 5
#7 Andersson Hans 5
#8 Krapu Mikko 5
#9 Kämäräinen Veikko 4
#10 Puusaari Erkki 4

Latest patents

Publication Filing date Title
FI20175121L Radiation window
US2015085977A1 Portable analyzer with radiation safety features
US2015085976A1 X-ray fluorescence analyzer with safety features
CN103515468A Leakage current collection structure and radiation detector with the same
CN103515175A Two-dimensional guard structure and radiation detector with the same
US2014353786A1 Semiconductor detector with radiation shield
US2014346630A1 Semiconductor detector head and a method for manufacturing the same
EP2180530A1 A method for patterning a detector crystal, and a semiconductor detector having a patterned crystal
EP2116842A1 An X-ray fluorescence analyzer with gas-filled chamber
EP2096431A1 Portable X-ray fluorescence analyzer
US2008317209A1 Gas tight radiation window, and a method for its manufacturing
US2008309936A1 Spectrometer with multiple gratings
US2008265358A1 Method for patterning detector crystal using Q-switched laser
US2008267348A1 Filter for X-ray radiation, and an arrangement for using filtered X-ray radiation for excitation
US2008151241A1 Practical laser induced breakdown spectroscopy unit
US2008095309A1 Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser
US2008095318A1 Selective irradiation of small target area in X-ray fluorescent spectroscopy
US2007269003A1 X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure
US2007230664A1 Collimator for x-ray spectrometry, and an x-ray spectrometric apparatus
US7203283B1 X-ray tube of the end window type, and an X-ray fluorescence analyzer