Learn more

OPTEX FA CO LTD

Overview
  • Total Patents
    29
  • GoodIP Patent Rank
    210,622
  • Filing trend
    ⇩ 100.0%
About

OPTEX FA CO LTD has a total of 29 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2002. It filed its patents most often in Japan and United States. Its main competitors in its focus markets environmental technology and computer technology are Jiangsu ziguang intelligent system co ltd, SHANGHAI PIKE INFORMATION TECHNOLOGY CONSULTING CO LTD and NINGBO MOMI INNOVATION WORKS ELECTRONIC TECHNOLOGY CO LTD.

Patent filings in countries

World map showing OPTEX FA CO LTDs patent filings in countries
# Country Total Patents
#1 Japan 28
#2 United States 1

Patent filings per year

Chart showing OPTEX FA CO LTDs patent filings per year from 1900 to 2020

Focus industries

Top inventors

# Name Total Patents
#1 Yuguchi Tasuku 19
#2 Takama Takeshi 2
#3 Aoi Akihiro 2
#4 Moriya Tomoaki 2
#5 Nishida Tetsuo 1
#6 Sugita Takashi 1
#7 Seguchi Junichi 1
#8 Kawasaki Yoichi 1
#9 Kimura Hideo 1
#10 Komatsu Kenji 1

Latest patents

Publication Filing date Title
JP2019117068A Three-dimensional position information creation method and device for loosely stacked goods
JP2015184263A Inspection system and inspection method of pantagraph slider
JP2015137890A Alignment system
JP2013254766A Led lighting device for image processing
JP2013246952A Lighting device for inspection
JP2013161611A Ring-shaped lighting device
JP2010262820A Constant current driving type led lighting device
JP2010257867A Lighting system
JP2009210565A Light quantity monitor sensor and image processing system equipped with this
JP2010118194A Led lighting device
JP2009060312A Differential communication circuit with offset voltage compensation
JP2009003839A Image processing device
JP2008275414A Image processing device
JP2008276466A Image processor
JP2008166101A Light irradiation device capable of varying emission spectrum
JP2007265120A Image processing system having lighting system with luminance correction
JP2007133715A Method and apparatus for processing image
JP2007135031A Image processing method and apparatus
JP2007040778A Pattern inspection method and pattern inspection device
JP2006235700A Pattern-teaching method and device in signal processor