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OLYMPUS NDT

Overview
  • Total Patents
    62
  • GoodIP Patent Rank
    217,199
About

OLYMPUS NDT has a total of 62 patent applications. Its first patent ever was published in 2006. It filed its patents most often in China, United States and EPO (European Patent Office). Its main competitors in its focus markets measurement, basic communication technologies and machines are GE INSPECTION TECH GMBH, INVITROX INC and IHI INSPECTION AND INSTR CO LTD.

Patent filings in countries

World map showing OLYMPUS NDTs patent filings in countries

Patent filings per year

Chart showing OLYMPUS NDTs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Thomas Andrew 17
#2 Lepage Benoit 14
#3 Drummy Michael 13
#4 Besser Steven 10
#5 Toomey Jason 9
#6 Langlois Pierre 8
#7 Rager Kirk 3
#8 Jason Toomey 3
#9 Vachon Patrick 3
#10 Nye Les 3

Latest patents

Publication Filing date Title
DE102013017150A1 Hall probe with exchangeable wear tips
CN102890096A An x-ray analysis apparatus with detector window protection feature
CN102854209A X-ray analysis apparatus and x-ray analysis method
CN102221580A Automatic calibration error detection for ultrasonic inspection devices
CN102635620A Self-alignment fastening assembly
CN102072938A Ultrasonic internal rotating inspection probe capable of self-eliminating air bubbles
EP2284529A1 An eddy current probe assembly adjustable for inspecting test objects of different sizes
EP2249152A2 A method and system for distance gain sizing using phased array systems
EP2233921A1 A method and system for transducer element fault detection for phased array ultrasonic instruments
US2010103016A1 Sample error minimization for high dynamic range digitization systems
US2010007342A1 High resolution and flexible eddy current array probe
US2010044008A1 Portable environmentally robust enclosure optimized for size, weight, and power dissipation
US2009045994A1 Multiple mode digitization system for a non-destructive inspection instrument
US2008314153A1 Hand-held flaw detector imaging apparatus
EP2000768A1 GPS enabled datalogging system for a non-destructive testing instrument
US2008315871A1 Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
US2008246468A1 Method and algorithms for inspection of longitudinal defects in an eddy current inspection system
US2008129152A1 Cable direct interconnection (CDI) method for phased array transducers
CN101495043A Ultrasonic detection measurement system using a tunable digital filter with 4X interpolator
US2007084288A1 Ultrasonic fault detection system using a high dynamic range analog to digital conversion system