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NIX STEINGROEVE ELEKTRO PHYSIK

Overview
  • Total Patents
    55
About

NIX STEINGROEVE ELEKTRO PHYSIK has a total of 55 patent applications. Its first patent ever was published in 1962. It filed its patents most often in Germany, United States and United Kingdom. Its main competitors in its focus markets measurement, electrical machinery and energy and machines are PERTHEN JOHANNES DR ING, GERHARDT MESSMASCHB KG and TAYLOR HOBSON LTD.

Patent filings in countries

World map showing NIX STEINGROEVE ELEKTRO PHYSIKs patent filings in countries
# Country Total Patents
#1 Germany 27
#2 United States 14
#3 United Kingdom 8
#4 France 6

Patent filings per year

Chart showing NIX STEINGROEVE ELEKTRO PHYSIKs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Steingroever Erich Dr Ing 8
#2 Nix Hans F 7
#3 Steingroever Erich 6
#4 Nix Hans F Ing Grad 4
#5 Nix Hans 3
#6 Caspers Friedhelm 2
#7 Caspers Friedhelm Dipl Ing 2
#8 Nix Hans Friedrich 2
#9 Steingroever Erich A 2
#10 Nix Hans-Friedrich 2

Latest patents

Publication Filing date Title
DE19841325A1 Nondestructive method to determine position-course of metal body in non metallic magnetic material
DE19832394C1 Magnetic thickness meter for nonmagnetic coatings on ferromagnetic material developed for rapid, simple paint thickness measurement with indication of condition of underlying steel plate
DE19735433A1 Measuring probe for measuring thin layers using a magnetic or eddy current method
DE19722014A1 Measuring probe for measuring the thickness of layers on a substrate
DE4128882A1 Rolling probe for the continuous measurement of the thickness of layers or strips
DE4105135A1 Testing insulating films etc. for pores - by passing between high voltage DC electrode and earthed sleeved roller with netting type spacer wound round roller to prevent contact
DE3401466A1 PROBE FOR CONTINUOUS MEASUREMENT OF THE THICKNESS OF LAYERS OR TAPES
DE3135263A1 METHOD AND DEVICE FOR NON-DESTRUCTIVE MEASUREMENT OF MATERIAL MATCHING OR LAYER THICKNESSES OF DIELECTRIC MATERIALS, IN PARTICULAR PLASTIC
DE3120896A1 Magnetic layer-thickness meter in pencil form
US4392305A Pencil shaped magnetic coating thickness gauge
DE3107675A1 METHOD AND DEVICE FOR ELECTRONICALLY MEASURING THE THICKNESS OF VERY THIN ELECTRICALLY CONDUCTIVE LAYERS ON NON-CONDUCTIVE SUPPORT MATERIAL
DE3021096A1 Contactless measuring of substance concn. in dielectric materials - using reflected component of HF electromagnetic wave as grade for substance thickness or vol.
DE3013596A1 MAGNETIC LAYER THICKNESS
GB1562444A Method of calibrating magnetic layerthickness gauges
DE2638248A1 MAGNETIC THICKNESS GAUGE
DE2630099A1 MAGNETIC THICKNESS GAUGE
US4160208A Method of calibrating magnetic thickness gauges
DE2558897A1 PROCEDURES FOR CALIBRATING FILM THICKNESS MEASURING DEVICES
US3976935A Apparatus for measuring the internal field intensity of magnet bodies
DE2452615A1 Measurement of internal field strength of magnetic materials - C-shaped potential coil is placed in open magnetic field