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NIPPON LASER DENSHI KK

Overview
  • Total Patents
    80
About

NIPPON LASER DENSHI KK has a total of 80 patent applications. Its first patent ever was published in 1986. It filed its patents most often in Japan, United States and Canada. Its main competitors in its focus markets measurement, organic fine chemistry and surface technology and coating are FANG YE, WALT DAVID R and INTRINSIC BIOPROBES INC.

Patent filings in countries

World map showing NIPPON LASER DENSHI KKs patent filings in countries
# Country Total Patents
#1 Japan 74
#2 United States 4
#3 Canada 1
#4 EPO (European Patent Office) 1

Patent filings per year

Chart showing NIPPON LASER DENSHI KKs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Tajima Haruo 46
#2 Yoneda Katsumi 29
#3 Yoneda Hidekatsu 7
#4 Nagata Ryohei 6
#5 Tanaka Koji 6
#6 Nakamura Hiroyuki 6
#7 Sato Kimiharu 6
#8 Sato Takato 6
#9 Hattori Shuzo 5
#10 Fukao Yasuhiro 5

Latest patents

Publication Filing date Title
JP2004279286A Method and device for evaluating optically anisotropic thin film
JP2004061286A Surface plasmon resonance angle sensor
JP2003247983A Target substance mass spectrometric system
JP2003172701A Device for analyzing sample chip
JP2003156490A Protein chip holding tool
JP2003052373A Sensor tip using calcium ion dependent short chain deoxyribozyme and method for detecting base sequence
US2002106804A1 Method for analyzing reaction test sample using test sample chip
CA2408767A1 Method and device for prepaping polynucleotide microarray and polynucleotide microarray
JP2002243733A Manufacture of sample chip, and method of analyzing reaction sample
JP2002228671A Suction and discharge-switching device for sample solution spotting apparatus
JP2002181817A Polynucleotide array production method
JP2002131319A Method for measuring protein for inflammation marker
JP2002122600A Sensor chip for biosensor
JP2002122579A Adsorbent for chromatography
JP2002066770A Laser marking system
JP2002062255A Detector for detecting surface plasmon resonance angle and fluorescence concurrently
JP2002022744A Device and method for analyzing sample chip
JP2002014106A Sample disk, and sample analyzer
JP2002004056A Plasma enhanced film deposition system for conductive metallic thin film
JP2001343384A Hybridizing method and dehybridizing method of sample chip