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NII PRIKLADNYCH

Overview
  • Total Patents
    361
About

NII PRIKLADNYCH has a total of 361 patent applications. Its first patent ever was published in 1979. It filed its patents most often in USSR (Union of Socialist Soviet Republics), Russian Federation and Switzerland. Its main competitors in its focus markets basic materials chemistry, organic fine chemistry and measurement are KEY FRIES INC, DEMUS DIETRICH and BRINE ADD FLUIDS LTD.

Patent filings in countries

World map showing NII PRIKLADNYCHs patent filings in countries

Patent filings per year

Chart showing NII PRIKLADNYCHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kolyada Andrej A 54
#2 Yakushev Aleksandr K 45
#3 Titov Aleksandr D 28
#4 Protsko Sergej V 26
#5 Selyaninov Mikhail Yu 24
#6 Chernyavskij Aleksandr F 21
#7 Danilevich Vsevolod V 21
#8 Khapalyuk Aleksandr P 17
#9 Revinskij Viktor V 17
#10 Chernobaj Ivan A 16

Latest patents

Publication Filing date Title
RU2020668C1 Corner reflector
RU2014651C1 Scanning x-ray microscope with linear raster
RU2022257C1 Infrared moisture meter to measure moisture content of capacitor paper
RU1824550C Spectrofluorimeter
RU1800292C High-speed multichannel spectrometer
RU1807351C Standard for calibrating spectrofluorometer
RU1800289C Method of measuring radiation flux density from distant source
RU1825971C Polarization arrangement for measuring twist angles
RU1783319C Method of determination of density of radiation flow from moving distant source of radiation
RU1800288C Method of determining flux density of radiation from a moving remote object
SU1774304A1 Prismatic corner reflector
RU1778498C Prism corner reflector
RU1783593C Sharp-focused x-ray source
RU1821651C Method for determining radiant flux density at varying relative position of source and photometer
SU1755103A1 Method of making a silicon specimen with angle lap
RU1800287C Method of determining radiation flux density at variable relative orientation of photometer and remote radiation source
RU1800309C Method of preparing silicon specimen for determining flaws of structure
RU1821841C Process of layer by layer etching of semiconductor materials
RU1798816C System for formation of microstructure on resist
SU1756887A1 Device for integer division in modulo notation