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NF CORP

Overview
  • Total Patents
    73
  • GoodIP Patent Rank
    105,395
  • Filing trend
    ⇧ 200.0%
About

NF CORP has a total of 73 patent applications. It increased the IP activity by 200.0%. Its first patent ever was published in 1998. It filed its patents most often in Japan, EPO (European Patent Office) and United States. Its main competitors in its focus markets environmental technology, electrical machinery and energy and basic communication technologies are LAWSON LABS INC, ENU ESU KK and LESSO JOHN PAUL.

Patent filings in countries

World map showing NF CORPs patent filings in countries

Patent filings per year

Chart showing NF CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Araki Kuniya 11
#2 Sofukawa Shingo 7
#3 Nakajima Takeshi 6
#4 Watanabe Takeyoshi 6
#5 Hayashi Toshiyuki 5
#6 Ishibashi Masahiro 5
#7 Sobukawa Shingo 4
#8 Aizono Takeo 4
#9 Aizono Takeiki 4
#10 Furukawa Osamu 4

Latest patents

Publication Filing date Title
JP2020031442A Lock-in amplifier
WO2019216274A1 Capacitance measuring circuit, and capacitance displacement meter
JP2020027991A Current amplification circuit
JP2020022008A Amplifier circuit
JP2019144171A Electronic load unit
JP2018170694A Amplifier circuit and amplifier device
JP2018036089A Asynchronous FRA and synchronous detector
JP2017183862A Current amplification device for photoelectric conversion element
JP2016220104A Changeover circuit of electronic circuit including amplification means and electronic circuit
JP2016208340A Lock-in amplifier
JP2016101066A Isolated operation detector and detection method and distributed power supply
JP2016073130A Switching power supply
JP2015159636A Power supply device and voltage source connection determination circuit
JP2015070536A Current feedback amplification circuit
JP2015061429A Power storage system and control method therefor
JP2015012705A Power storage system and operation method therefor
JP2014212485A Amplifier circuit
EP2566048A2 Amplifier circuit
JP2013134135A Probe bar
JP2012215459A Defect inspection device and defect inspection method for solar battery