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NANOTRONICS IMAGING INC

Overview
  • Total Patents
    95
  • GoodIP Patent Rank
    15,120
  • Filing trend
    ⇧ 75.0%
About

NANOTRONICS IMAGING INC has a total of 95 patent applications. It increased the IP activity by 75.0%. Its first patent ever was published in 2015. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and Taiwan. Its main competitors in its focus markets computer technology, optics and audio-visual technology are SCOPIO LABS LTD, HURON TECH INTERNATIONAL INC and AUXORA SHENZHEN INC.

Patent filings per year

Chart showing NANOTRONICS IMAGING INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Putman Matthew C 71
#2 Putman John B 67
#3 Pinskiy Vadim 40
#4 Fashbaugh Dylan 22
#5 Orlando Julie 19
#6 Limoge Damas 14
#7 Scott Brandon 14
#8 Putman Matthew 14
#9 Pozzi-Loyola Scott 12
#10 Moskie Michael 11

Latest patents

Publication Filing date Title
US2021069990A1 Systems, Methods, and Media for Manufacturing Processes
WO2021050508A1 Systems, methods, and media for manufacturing processes
US2020326785A1 Apparatus and method for manipulating objects with gesture controls
US2021103654A1 Dynamic monitoring and securing of factory processes, equipment and automated systems
WO2020215093A1 Systems, methods, and media for artificial intelligence process control in additive manufacturing
US2020293019A1 Assembly error correction for assembly lines
WO2020176908A1 Assembly error correction for assembly lines
US2020247063A1 Systems, methods, and media for artificial intelligence process control in additive manufacturing
WO2020163267A1 Fluorescence microscopy inspection systems, apparatus and methods
US10915992B1 System, method and apparatus for macroscopic inspection of reflective specimens
US2020401119A1 Predictive process control for a manufacturing process
US10578850B1 Fluorescence microscopy inspection systems, apparatus and methods
US10481579B1 Dynamic training for assembly lines
US10545096B1 Marco inspection systems, apparatus and methods
US10481379B1 Method and system for automatically mapping fluid objects on a substrate
TW201923411A Apparatus and method to reduce vignetting in microscopic imaging
US10169852B1 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging
US10173246B1 Systems, apparatus, and methods for sorting components using illumination
US10146041B1 Systems, devices and methods for automatic microscope focus
US2019299536A1 Systems, methods, and media for artificial intelligence feedback control in additive manufacturing